Neeraj Mishra

A static timing analysis (STA) methodology based on an effective current source model (ECSM) is proposed for the first time for estimating the aging aware path-level timing performance and its impact on the logical effort of a CMOS inverter for digital timing closure in pre-stress and post-stress conditions. Degradation in the threshold voltage (Vth) of PMOS occurs due to temporal variability mechanisms (aging), such as negative bias temperature instability, resulting in delay degradation of a… Show more

A static timing analysis (STA) methodology based on an effective current source model (ECSM) is proposed for the first time for estimating the aging aware path-level timing performance and its impact on the logical effort of a CMOS inverter for digital timing closure in pre-stress and post-stress conditions. Degradation in the threshold voltage (Vth) of PMOS occurs due to temporal variability mechanisms (aging), such as negative bias temperature instability, resulting in delay degradation of a standard cell. Therefore, we proposed a technique to make the STA process aware of this degradation by developing device-level variation aware (with aging) timing models of CMOS inverters to represent threshold-crossing points (TCPs) in an ECSM.libs file as a function of stress time (t). A device-level approach for Vth degradation into different aging conditions, such as static and dynamic, is developed for a given process design kit to update TCPs in a (.libs) file as a function of t. A python-based tool is being developed to estimate the path-level timing performance of digital circuits in pre-and post-stress conditions. Again, we developed a technique for relating the inverter’s logical effort with t to resize a near-critical path in pre-stress conditions for achieving digital timing closure in pre-and post-stress conditions. The verification and validation of the proposed model with different benchmark circuits are performed using a parasitic extracted netlist in Eldo SPICE environment with 65 nm CMOS process technology. Finally, our model reduces the number of SPICE/Stress simulations by 98.13% compared to the previously reported only simulation-based techniques. Show less

In this paper, for the first time, the phase noise analysis of a Multi-loop Skew based Single Ended Oscillator (MSSROs) is derived and validated. Compared to the three stages of conventional ring oscillators (CROs), SDROs provide an equivalent oscillation frequency with improved phase noise with increasing stages. The primary distinction between these two designs (SDRO and three-stage CROs) is the inherent skew offset between the PMOS/NMOS gates caused by the unique connection. This skew offset… Show more

In this paper, for the first time, the phase noise analysis of a Multi-loop Skew based Single Ended Oscillator (MSSROs) is derived and validated. Compared to the three stages of conventional ring oscillators (CROs), SDROs provide an equivalent oscillation frequency with improved phase noise with increasing stages. The primary distinction between these two designs (SDRO and three-stage CROs) is the inherent skew offset between the PMOS/NMOS gates caused by the unique connection. This skew offset is the fundamental cause of delay cell noise suppression; the SDROs have loosely coupled oscillators that run concurrently, forming multiple 3-stages of separately driven Ring Oscillators. As a result, a shaping function is derived in terms of skew offset, and simulating these with varying skew offset results in suppressing behavior. Additionally, we derived phase noise for a skew-based design and validated it in PDKs of 180nm and 65 nm. We plotted the thermal (flicker) noise contribution and found that increasing the number of stages leads to an approximately 1-2 dB reduction in phase noise while maintaining the same NMOS/PMOS size ratio. Finally, a 2-3 dB reduction in phase noise is achieved in MSSROs by incorporating the shaping function into phase noise equations. Show less

A time-domain jitter estimation methodology considering process-voltage-temperature (PVT) variations of the single-ended ring oscillator (SERO) at an early stage of design is presented for near-threshold voltage (NTV) regime where nonlinearities dominates. For the first time, the model accounts for the jitter due to the over/undershoot region which is critical in the NTV regime. Further, the model uses effective drive current, Ieff model. The Ieff is obtained considering the regions of device… Show more

A time-domain jitter estimation methodology considering process-voltage-temperature (PVT) variations of the single-ended ring oscillator (SERO) at an early stage of design is presented for near-threshold voltage (NTV) regime where nonlinearities dominates. For the first time, the model accounts for the jitter due to the over/undershoot region which is critical in the NTV regime. Further, the model uses effective drive current, Ieff model. The Ieff is obtained considering the regions of device operation, instead of using only saturation current for jitter calculation. A time-domain jitter model is developed by considering the change in transition threshold points (TTPs) whose relative values are supply independent and Ieff of each region with the PVT variation, design parameters, and with the introduction of noise in the circuit. The model analyzes the effects of random (white noise) and deterministic (supply, substrate) noise in the NTV regime. This approach is physics/topologybased and is valid for different technologies. Post-layout simulations have been performed on parasitic extracted netlist using CADENCE and HSPICE in STM 65nm CMOS Process Design Kit (PDK) to validate the jitter model in the NTV regime. Show less

This brief presents a general technique for achieving the highest possible RO oscillation frequency accompanied by lower phase noise in an enhanced circuit design utilizing novel delay cells. The circuit architecture has the delay cells’ inputs separated by an optimized skew offset. Skew-offset optimization is attained by integrating a pre-charge/discharge auxiliary feed-forward loop into the separately driven delay cells. This technique reduces the transition time when Supply and GND are… Show more

This brief presents a general technique for achieving the highest possible RO oscillation frequency accompanied by lower phase noise in an enhanced circuit design utilizing novel delay cells. The circuit architecture has the delay cells’ inputs separated by an optimized skew offset. Skew-offset optimization is attained by integrating a pre-charge/discharge auxiliary feed-forward loop into the separately driven delay cells. This technique reduces the transition time when Supply and GND are simultaneously connected/disconnected to the delay cell’s output node. When these delay cells are connected in loops to form a Ring Oscillator, they provide high performance, even/odd multi-phase signals. The proposed methodology is validated in commercial 65nm and 180nm CMOS technologies. The post-layout simulations show that the proposed designs improve the performance by modulating the delay cell output node’s charging and discharging. The operating frequency of the proposed design, e.g., for odd stage 5/7 and even stage 4/8/16 stage, is almost 50%/40%, (80%/30%/20%) higher than that of the MSSRO (Multi-Loop Skew based Single-ended Ring Oscillator) with the same number of stages. Additionally, the designs proposed for the targeted phase noise and center frequency consume around 8–20% (odd stages)/ (6–28%) (Even stages) lesser power, a lower supply sensitivity up to 9%, and lower PVT variability up to 6% compared to its equivalent stages MSSRO (3-stages single-ended RO) counterparts in 180 nm CMOS Technology. Show less

In this paper, a variation-aware design methodology for high performance MOS-varactor voltage-controlled ring oscillator (MV-VCRO) in near-threshold-voltage (NTV) regime is proposed. The MV-VCRO is suitable because it eliminates series-stack transistors and generates rail-to-rail swing. For the first time, delay-models for conventional, bulk-driven (BD), and dynamic-threshold (DT) MV-VCROs considering non-linearity in NTV regime is presented using effective drive current (Ieff) and MOS-varactor… Show more

In this paper, a variation-aware design methodology for high performance MOS-varactor voltage-controlled ring oscillator (MV-VCRO) in near-threshold-voltage (NTV) regime is proposed. The MV-VCRO is suitable because it eliminates series-stack transistors and generates rail-to-rail swing. For the first time, delay-models for conventional, bulk-driven (BD), and dynamic-threshold (DT) MV-VCROs considering non-linearity in NTV regime is presented using effective drive current (Ieff) and MOS-varactor capacitance models. The proposed design methodology is intuitive and considers process-voltage-temperature (PVT) variations at an initial stage of the design for width-length optimization. The methodology is highly efficient and does not require performing time-consuming Monte-Carlo (MC) simulations at post-layout stages. Look-up-tables (LUTs) for MOS-varactor average-capacitances, and Ieff are generated while considering the regions of device operation during MV-VCRO output-node transitions while extracting the model parameters from one-time simulations. This approach is physics/topology-based and is verified in HSPICE and Sentaurus 2D-TCAD simulations using STM65nm and 32nm respectively. The Ieff-models predict the oscillation frequency (fOSC) with an accuracy of 97%, 96%, 97% for conventional, BD, DT-MV-VCRO respectively. Further, our estimated LUT-Ieff-capacitance models account for the change in fOSC, TR, and VCO-gain with PVT variations with an accuracy-efficiency of 96%-99% compared to MC simulations. Furthermore, using LUTs, phase-noise, power-consumption, and layout-area optimization technique is presented for a particular fOSC. Finally, the design methodology ensures that the desired fOSC is within the “linear” range of the VCO’s-gain due to statistical variation of Vth, VDD, etc. This ensures resilience to PVT variations for NTV-VCO in linear feedback systems. Show less

A general approach for generating high-frequency multiphase signals (even/odd), low phase noise, low power, and reduced supply sensitivity ring oscillators (ROs). For the same, multi-loop skew based single-ended ring oscillators (MSSROs) are designed and systematic analysis is performed. The topology is based on a unique feedback/feed-forward mechanism for realizing a fast loop in a long chain RO wherein the PMOS/NMOS of the stages are separately driven. This unique connection in MSSROs results… Show more

A general approach for generating high-frequency multiphase signals (even/odd), low phase noise, low power, and reduced supply sensitivity ring oscillators (ROs). For the same, multi-loop skew based single-ended ring oscillators (MSSROs) are designed and systematic analysis is performed. The topology is based on a unique feedback/feed-forward mechanism for realizing a fast loop in a long chain RO wherein the PMOS/NMOS of the stages are separately driven. This unique connection in MSSROs results in a skew offset (negative/positive/zero) which is generated between the inputs of PMOS/NMOS as the number of stages are increased. Therefore, MSSROs provide the time period equal to that of 3-stage single-ended conventional ROs (SCRO) and a better phase noise (7–11%) even with a larger number of stages (even/odd). A model is developed to predict the oscillation frequency and skew offset. The proposed methodology is validated in commercial 65nm and 180nm CMOS technologies, also indicating scalability of the proposed designs at scaled CMOS nodes. The simulations show that, depending on the number of stages, the operating frequency of the MSSROs varies from −25 (−11) % (positive-skew) to +16 (13) % (negative-skew) of its 3-stage SCRO counterparts in the 180nm (65nm) CMOS technology. Moreover, for a target phase noise and center frequency, the MSSROs consume about 8–30 (5–23) % lower power and up to 8% lower supply sensitivity as compared to its 3-stage SCRO counterparts in the 180nm (65nm) CMOS technology. The MSSRO also has a better PVT variation tolerance compared to SCRO. Show less

Due to the highly variation-prone nature of the near-threshold voltage (NTV) circuits, it is critical to have design and performance models that consider process, voltage, and temperature (PVT) variations. However, in the NTV regime, the existing timing models are based on arbitrarily chosen VDD-dependent threshold points for effective current calculation that results in unreliability. In this article, an effective current delay model for an inverter operating in NTV regime is presented using… Show more

Due to the highly variation-prone nature of the near-threshold voltage (NTV) circuits, it is critical to have design and performance models that consider process, voltage, and temperature (PVT) variations. However, in the NTV regime, the existing timing models are based on arbitrarily chosen VDD-dependent threshold points for effective current calculation that results in unreliability. In this article, an effective current delay model for an inverter operating in NTV regime is presented using supply-independent threshold points. The model is developed considering the input-output coupling capacitance and by relating the input and output currents of an inverter stage. This approach is physics-/topology-based and is valid for different technologies. This has been verified against HSPICE simulations and Synopsys Sentaurus 3-D technology computer-aided design (TCAD) simulations for STM 65-nm MOSFETs and 16-nm fin-shaped field-effect transistors (FinFETs), respectively, at different supply voltages, considering variation in threshold voltage and at different operating temperatures. The model predicts the transition delay values with an average (maximum) error of 3% (6%) and 4% (6%) for MOSFET and FinFET, respectively. Furthermore, the model is employed for digital buffer chain and single-ended ring oscillators (SEROs) for a wide range of supply voltages. Finally, we show an application of the model to calculate the change in the oscillation frequency of SERO with PVT variations and compare the same with the time-consuming Monte Carlo simulations. Show less

Due to small output swings and series stack transistors, Differential Ring Oscillators (DRO) and current starved ROs are not well suited for Near Threshold Voltage (NTV) regime. MOS varactor based Single Ended Ring Oscillators (SERO) is well suited in NTV regime as it gives full swing characteristics, wide tuning range and has very low power consumption. This paper proposes different architectures using MOS Varactor SERO (VBRO) that gives high oscillation frequency, wide tuning range, low area… Show more

Due to small output swings and series stack transistors, Differential Ring Oscillators (DRO) and current starved ROs are not well suited for Near Threshold Voltage (NTV) regime. MOS varactor based Single Ended Ring Oscillators (SERO) is well suited in NTV regime as it gives full swing characteristics, wide tuning range and has very low power consumption. This paper proposes different architectures using MOS Varactor SERO (VBRO) that gives high oscillation frequency, wide tuning range, low area and power consumption without degrading the phase noise as compared to existing VCO topologies in NTV regime. The improvement in the tuning range of the VCO is because of the change in body capacitance of the DTMOS configuration used in the VBRO. The change in the center frequency with PVT variations is compared with that of an NTV DRO. Post layout simulations have been performed on parasitic extracted netlist using HSPICE in industrial 65nm CMOS Process Design Kit (PDK). Our VBRO architecture has tuning range of 0.425 - 2.13 GHz with phase noise of -95dBc/Hz at 0.6V supply. The power consumption is only 127μW and the Figure Of Merit (FOM) is 164.96dBc/Hz. Show less

A wide tuning range, low VCO gain and a low PVT variations are the requirements for Ring Oscillators at near threshold voltages (NTV). Current starved ring oscillators (CSRO) have voltage headroom issues in NTV regime. A MOS varactor based single ended ring oscillator (SERO) is best suited for its full swing characteristics, wide tuning range and low power consumption. However, a high VCO gain and nonlinearity are its limitations. This paper proposes a bulk driven MOS varactor based SERO… Show more

A wide tuning range, low VCO gain and a low PVT variations are the requirements for Ring Oscillators at near threshold voltages (NTV). Current starved ring oscillators (CSRO) have voltage headroom issues in NTV regime. A MOS varactor based single ended ring oscillator (SERO) is best suited for its full swing characteristics, wide tuning range and low power consumption. However, a high VCO gain and nonlinearity are its limitations. This paper proposes a bulk driven MOS varactor based SERO (BD-MOS) that gives low VCO gain and a linear tuning from 0 to VDD in NTV regime. Post layout simulations have been performed on parasitic extracted netlist using HSPICE in industrial 65nm CMOS process design kit (PDK). The design is based on an analysis of MOS varactor capacitance done using 2D-Synopsis TCAD mixed-mode simulations Show less

In stress enabled technologies the drive strength of multi-fingered (MF) transistors varies with the number of fingers (NF) because of Layout Dependent Effect (LDE). This is an important issue because MF transistors are widely used in integrated circuits. In this paper, we investigate performance variability issues in basic analog building blocks, such as current mirrors, common source amplifiers, and single ended differential amplifiers, designed using MF transistors. We observe that, due to… Show more

In stress enabled technologies the drive strength of multi-fingered (MF) transistors varies with the number of fingers (NF) because of Layout Dependent Effect (LDE). This is an important issue because MF transistors are widely used in integrated circuits. In this paper, we investigate performance variability issues in basic analog building blocks, such as current mirrors, common source amplifiers, and single ended differential amplifiers, designed using MF transistors. We observe that, due to the layout dependent channel mechanical stress, the analog performance parameters of these building blocks vary significantly. When the NF in MF transistors varies from one to seven, we observe that the copy current in cascode current mirrors vary by ~15%. For similar change in the NF there is ~22% and ~24% change in the bandwidth (BW) and the output resistance (Rout) respectively of an nMOS common source amplifier with pMOS current source load. We observe variations of ~32% in slew rate (SR), ~28% in BW, and ~12.4% in Rout with the change in NF in a single ended differential amplifier. We model these variations as a function of NF in MF transistors since performance predictability in analog circuits is important. Finally, we designed a common source amplifier considering the impact of channel length on channel stress. Show less